Two-dimensional subwavelength focusing using a slotted meta-screen

IEEE Microwave and Wireless Components Letters

Volumn 19, Issue 3, 2009, Pages 137-139

  Markley, Loïc ^a   Eleftheriades, George V ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

Diffraction limit; Metamaterials; Near field focusing

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; ELECTRON OPTICS; METAMATERIALS;

A-SPOTS; BEAM WIDTHS; DIFFRACTION LIMIT; ELECTROMAGNETIC RADIATIONS; EXPERIMENTAL MEASUREMENTS; FOCAL PLANES; FULL WIDTH HALF MAXIMUMS; FULL-WAVE SIMULATIONS; IMAGE DEGRADATIONS; NEAR-FIELD FOCUSING; NEGATIVE REFRACTIVE INDICES; SLOT DIMENSIONS; SUB WAVELENGTHS; SUBWAVELENGTH FOCUSING; TERAHERTZ FREQUENCIES; TWO-DIMENSIONAL; WEIGHTING FACTORS;

FOCUSING;

EID: 62449129807     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2009.2013679     Document Type: Article

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