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Volumn 101, Issue 11, 2008, Pages
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Spatially shifted beam approach to subwavelength focusing
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Author keywords
[No Author keywords available]
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Indexed keywords
METALS;
MICROWAVE FREQUENCIES;
MICROWAVES;
ANALYTICAL MODELLING;
BEAM APPROACH;
BEAM PATTERNS;
DIFFRACTION LIMITS;
FULL-WAVE SIMULATIONS;
META-MATERIALS;
NEAR FIELDS;
NEGATIVE-REFRACTIVE-INDEX;
OPTICAL-;
SUB-WAVELENGTH;
SUBWAVELENGTH FOCUSSING;
IMAGE RESOLUTION;
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EID: 51849144207
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.101.113901 Document Type: Article |
Times cited : (89)
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References (14)
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