A resolution measure for three-dimensional microscopy

Optics Communications

Volumn 282, Issue 9, 2009, Pages 1751-1761

  Chao, Jerry ^a,b   Ram, Sripad ^b   Abraham, Anish V ^a,b   Sally Ward, E ^b   Ober, Raimund J ^a,b  

^a The University of Texas at Dallas   (United States)

^b UNIVERSITY OF TEXAS SOUTHWESTERN MEDICAL CENTER   (United States)

Author keywords

Axial resolution; Cramer Rao lower bound; Information theory; Optical microscopy; Three dimensional microscopy

Indexed keywords

CONTROL THEORY; CRAMER-RAO BOUNDS; INFORMATION THEORY; MAXIMUM LIKELIHOOD ESTIMATION; OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; PARAMETER ESTIMATION; THREE DIMENSIONAL;

3-D SPACES; 3D RESOLUTIONS; AXIAL RESOLUTION; CONVENTIONAL OPTICAL MICROSCOPES; CRAMER-RAO LOWER BOUND; MAXIMUM LIKELIHOOD ESTIMATORS; NOISE SOURCES; POINT SOURCES; RESOLUTION LIMITS; SIMULATED IMAGES; SPATIAL ORIENTATIONS; THREE-DIMENSIONAL (3D); THREE-DIMENSIONAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 62349128616     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2009.01.062     Document Type: Article

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