메뉴 건너뛰기




Volumn 113, Issue 1, 2009, Pages 49-53

Grazing incidence X-ray diffraction of a photoaligned nematic semiconductor

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; ELECTRIC CONDUCTIVITY; HOLE MOBILITY; LIGHT; LIGHT SOURCES; LIQUID CRYSTALS; MICROPHASE SEPARATION; MOLECULES; NEMATIC LIQUID CRYSTALS; SEMICONDUCTOR MATERIALS; THIOPHENE; X RAY DIFFRACTION;

EID: 61949478656     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp803379a     Document Type: Article
Times cited : (11)

References (44)
  • 36
    • 33744787414 scopus 로고    scopus 로고
    • Dunmur, D. A, Fukuda, A, Luckhurst, G, Eds, Institute of Electrical Engineers: Stevenage, UK
    • Ungar, G. Physical Properties of Liquid crystals: Nematics; Dunmur, D. A., Fukuda, A., Luckhurst, G., Eds.; Institute of Electrical Engineers: Stevenage, UK, 2000.
    • (2000) Physical Properties of Liquid crystals: Nematics
    • Ungar, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.