Direct observation of femtosecond laser induced modifications in the bulk of fused silica by phase contrast microscopy

Journal of Laser Micro Nanoengineering

Volumn 1, Issue 3, 2006, Pages 155-160

  Mermillod Blondin, Alexandre ^a,b   Burakov, Igor M ^c   Stoian, Razvan ^a,b   Rosenfeld, Arkadi ^a   Audouard, Eric ^b   Bulgakova, Nadezhda ^c   Hertel, Ingolf V ^a,d  

^a MAX BORN INSTITUT   (Germany)

^b UNIVERSITÉ JEAN MONNET   (France)

^c KUTATELADZE INSTITUTE OF THERMOPHYSICS   (Russian Federation)

^d FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Glass processing; Microexplosion; Phase contrast microscopy; Refractive index changes; Ultrafast processing; Ultrashort pulse propagation

Indexed keywords

EID: 61949389673     PISSN: None     EISSN: 18800688     Source Type: Journal    
DOI: 10.2961/jlmn.2006.03.0001     Document Type: Article

References (25)

1. J. K. Ranka, R. W. Schirmer, and A. L. Gaeta: Phys. Rev. Lett., 77, (1996) 3783
2. K. M. Davis, K. Miura, N. Sugimoto, and K. Hirao: Opt. Lett., 21, (1996) 1729
3. L. Sudrie, M. Franco, B. Prade, and A. Mysyrowicz: Opt. Commun., 171, (1999) 279
4. S. Nolte, M. Will, J. Burghoff, and A. Tuennermann: Appl. Phys. A, 77, (2003) 109
5. E.N. Glezer, M. Milosavljevic, L.Huang, R.J. Finlay, T.-H. Her, J.P. Callan, and E. Mazur: Opt. Lett., 21, (1996) 2023
6. R.S. Taylor, C. Hnatovsky, E. Simova, D.M. Rayner, V.M. Rayner, V.R. Bhardwaj, and P.B. Corkum: Opt. Lett., 28, (2003) 1043
7. G. Petite, P. Daguzan, S. Guizard, and P. Martin: Nucl. Instrum. Methods. Phys. Res. B, 107, (1996) 97
8. P.N. Saeta, and B.I. Greene: Phys. Rev. Lett., 70, (1993) 3588
9. G. Petite, P. Daguzan, S. Guizard, and P. Martin: Appl. Surf. Sci., 109/110, (1997) 36
10. J.W. Chan, T.Huser, S.Risbud, and D.M. Krol: Opt. Lett., 26, (2001) 1726
11. A. Pasquarello, and R. Car: Phys. Rev. Lett., 80, (1998) 5145
12. B. Poumellec, L. Sudrie, M. Franco, B. Prade, and A. Mysyrowicz: Opt. Expr., 11, (2003) 1070
13. T. Gorelik, M. Will, S. Nolte, A. Tuennermann, and U. Glatzel: Appl. Phys. A, 76, (2003) 309
14. O. W. Richards: Science, 124, (1956) 810
15. C.B. Schaffer, A. Brodeur, J.F. García, and E. Mazur: Opt. Lett., 26, (2001) 93
16. A. Saliminia, N.T. Nguyen, S.L. Chin, and R. Vallée: Opt. Commun., 241, (2004) 529
17. R. Osellame, N. Chiodo, V. Maselli, A. Yin, M. Zavelani-Rossi, G. Cerullo, P. Laporta, L. Aiello, S. De Nicola, P. Ferraro, A. Finizio, and G. Pierattini: Opt. Expr., 13, (2005) 612
18. K. Yamada, W. Watanabe, T. Toma, and K. Itoh, Opt. Lett., 26, (2001) 19
19. C. G. Rylander, D. P. Davé, T. Akkin, T.E. Milner, K. R. Diller, and A. J. Welch: Opt. Lett., 29, (2004) 1509
20. A. Couairon, L. Sudrie, M. Franco, B. Prade, and A. Mysyrowicz: Phys. Rev. B, 71, (2005) 125435
21. E. N. Glezer, and E. Mazur: Appl. Phys. Lett., 71, (1997) 882
22. C. B. Schaffer, A.O. Jamison, and E. Mazur: Appl. Phys. Lett. 84, (2004) 1441
23. K. Miura, J. Qiu, H. Inouye, T. Mitsuyu, and K. Hirao: Appl. Phys. Lett., 71, (1997) 3329
24. G. Cerullo, R. Osellame, S. Taccheo, M. Marangoni, D. Polli, R. Ramponi, P. Laporta, and S. De Silvestri: Opt. Lett., 27, (2002) 1938
25. V.R. Bhardwaj, E. Simova, P.B. Corkum, D.M. Rayner, C. Hnatovsky, R.S. Taylor, B. Schreder, M. Kluge, and J. Zimmer: J. Appl. Phys., 97, (2005) 083102