Producing metastable nanophase with sharp interface by means of focused ion beam irradiation

Journal of Applied Physics

Volumn 105, Issue 4, 2009, Pages

  Barna, Árpád ^a   Kotis, László ^a   Lábár, János ^a   Osváth, Zoltán ^a   Tóth, Attila L ^a   Menyhárd, Miklós ^a   Zalar, Anton ^b   Panjan, Peter ^b  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

^b JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROSCOPY; AUGER ELECTRON SPECTROSCOPY; DEPTH PROFILING; FOCUSED ION BEAMS; IRRADIATION; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC FORCES; CONCENTRATION DISTRIBUTIONS; CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPIES; DOUBLE LAYERS; FLUENCE; ION BEAM IRRADIATIONS; ION IRRADIATIONS; MORPHOLOGY CHANGES; NANO-PHASE; SHARP INTERFACES;

IONS;

EID: 61449178934     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3079508     Document Type: Article

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