An analysis of imprinted hysteresis loops for a ferroelectric Pb (Zr,Ti) O3 thin film capacitor using the switching transient current measurements

Journal of Applied Physics

Volumn 105, Issue 4, 2009, Pages

  Kim, Gun Hwan ^a   Lee, Hyun Ju ^a   Jiang, An Quan ^b   Park, Min Hyuk ^a   Hwang, Cheol Seong ^a  

^a University Semiconductor Research Center   (South Korea)

^b FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC CURRENT MEASUREMENT; FERROELECTRICITY; HYSTERESIS; HYSTERESIS LOOPS; LEAD; OPTICAL DEVICES; OZONE WATER TREATMENT; PLATINUM; SWITCHING; THIN FILM CIRCUITS; ZIRCONIUM;

APPLIED VOLTAGES; COERCIVE VOLTAGES; FUNCTIONAL FORMS; IMPRINT MECHANISMS; INTERFACIAL CAPACITANCES; LOCAL SWITCHING; LOCALIZED CHARGES; PB(ZR , TI)O3; PULSE SWITCHING; REMANENT POLARIZATIONS; SWITCHING CHARGES; SWITCHING TRANSIENTS; THIN-FILM CAPACITORS;

CAPACITANCE;

EID: 61449173864     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3078104     Document Type: Article

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