Estimating cycle time percentile curves for manufacturing systems via simulation

INFORMS Journal on Computing

Volumn 20, Issue 4, 2008, Pages 628-643

  Yang, Feng ^a   Ankenman, Bruce E ^b   Nelson, Barry L ^b  

^a West Virginia University   (United States)

^b Northwestern University   (United States)

Author keywords

Design of experiments; Discrete event simulation; Queueing; Response surface modeling; Semiconductor manufacturing

Indexed keywords

EID: 61349190420     PISSN: 10919856     EISSN: 15265528     Source Type: Journal    
DOI: 10.1287/ijoc.1080.0272     Document Type: Article

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