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Volumn 50, Issue 6, 2002, Pages

D-optimal sequential experiments for generating a simulation-based cycle time-throughput curve

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MANUFACTURE; PRECISION ENGINEERING; PRODUCT DESIGN; THROUGHPUT;

EID: 0036878907     PISSN: 0030364X     EISSN: None     Source Type: Journal    
DOI: 10.1287/opre.50.6.981.347     Document Type: Article
Times cited : (42)

References (24)
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  • 9
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    • Efficient cycle time-throughput curve generation using a fixed sample size procedure
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    • Some remarks on cycle time, variability, zero inventories, and costs in microelectronics manufacturing lines. German Manufacturing Technology Center, Sindelfingen, Germany.
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    • Fromm, H.1
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    • Evaluation of commonly used rules for detecting "steady state" in computer simulation
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.