Nanoscale characterization of single Au nanorods by confocal microscopy

Applied Surface Science

Volumn 255, Issue 10, 2009, Pages 5391-5395

  Züchner, Tina ^a   Wackenhut, Frank ^a   Failla, Antonio Virgilio ^a,b   Meixner, Alfred Johann ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Confocal microscopy; Higher order laser modes; Nanophotonics; Particle plasmons; Single particle imaging

Indexed keywords

CONFOCAL MICROSCOPY; LASER MODES; NANOPHOTONICS; NANORODS; TOPOLOGY;

ACQUISITION TIME; DIELECTRIC MEDIA; HIGHER-ORDER; INTERFERENCE SCATTERING; NANOSCALE CHARACTERIZATION; PARTICLE PLASMONS; SCATTERING PATTERN; SINGLE PARTICLE;

SIGNAL TO NOISE RATIO;

EID: 61349154857     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.07.164     Document Type: Article

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