Comparative study of grain sizes and orientation in microstructured Au, Pt and W thin films designed by laser interference metallurgy

Applied Surface Science

Volumn 255, Issue 10, 2009, Pages 5626-5632

  Gachot, Carsten ^a   Catrin, Rodolphe ^a   Lasagni, Andrés ^b   Schmid, Ulrich ^c   Mücklich, Frank ^a  

^a SAARLAND UNIVERSITY   (Germany)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^c VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Laser processing; Materials science; Metallic thin films; Tailored microstructures

Indexed keywords

CRYSTAL MICROSTRUCTURE; DYNAMIC RECRYSTALLIZATION; GRAIN SIZE AND SHAPE; LEAD COMPOUNDS; MATERIALS SCIENCE; PLATINUM; THIN FILMS; TOPOGRAPHY;

ELECTRON BACK SCATTER DIFFRACTION; GRAIN SIZE DISTRIBUTION; LASER INTERFERENCE METALLURGY; LASER INTERFERENCE PATTERNS; LASER PROCESS; METALLIC THIN FILMS; PHYSICAL AND CHEMICAL PROPERTIES; RECRYSTALLIZATION PROCESS;

LASER MATERIALS PROCESSING;

EID: 61349090433     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.10.032     Document Type: Article

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