Variable-charge method applied to study coupled grain boundary migration in the presence of oxygen

Acta Materialia

Volumn 57, Issue 6, 2009, Pages 1988-2001

  Elsener, A ^a   Politano, O ^b   Derlet, P M ^a   Van Swygenhoven, H ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b LABORATOIRE INTERDISCIPLINAIRE CARNOT DE BOURGOGNE   (France)

Author keywords

Grain boundary migration; Interface defects; Molecular dynamics simulations

Indexed keywords

ATOMS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MOLECULAR DYNAMICS; OXYGEN; SLIP FORMING;

CRITICAL SHEAR STRESS; GRAIN BOUNDARY MIGRATION; GRAIN-BOUNDARY; INTERFACE DEFECTS; INTERNAL STRESS; METALLIC STRUCTURES; MOLECULAR DYNAMICS SIMULATIONS; STICK-SLIP PROCESS;

DYNAMICS;

EID: 60849113414     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2009.01.001     Document Type: Article

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