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Volumn 58, Issue 2, 2008, Pages 85-88
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Strain-induced migration of tilt grain boundaries
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Author keywords
Al; Grain boundary migration; Strain; X ray diffraction
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Indexed keywords
BICRYSTALS;
ENTHALPY;
FORMABILITY;
PARAMETER ESTIMATION;
STRAIN;
TEMPERATURE MEASUREMENT;
X RAY DIFFRACTION;
CHANNEL DIE EXPERIMENTS;
GRAIN BOUNDARY MIGRATIONS;
STRAIN INDUCED MIGRATIONS;
GRAIN BOUNDARIES;
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EID: 35548960847
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/j.scriptamat.2007.09.034 Document Type: Article |
Times cited : (24)
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References (24)
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