A new genetic design for error correcting code for power minimization

Journal of Circuits, Systems and Computers

Volumn 17, Issue 5, 2008, Pages 773-783

  Lee, Heesung ^a   Kim, Euntai ^a  

^a Yonsei University   (South Korea)

Author keywords

ECC; GA; Hamming code; Hsiao code; Power; SEC DED

Indexed keywords

DESIGN; ERROR CORRECTION; MICROPROCESSOR CHIPS;

ECC; GA; HAMMING CODE; HSIAO CODE; POWER; SEC-DED;

CACHE MEMORY;

EID: 60849102773     PISSN: 02181266     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218126608004654     Document Type: Article

References (12)

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