Surface segregation of aluminum atoms on Cu-9 at.% Al(1 1 1) studied by Auger electron spectroscopy and low energy electron diffraction

Surface Science

Volumn 603, Issue 4, 2009, Pages 723-726

  Yu, Yinghui ^a   Sagisaka, Keisuke ^a   Fujita, Daisuke ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Annealing temperature; Auger electron spectroscopy; Concentration; Low energy electron diffraction

Indexed keywords

ALUMINA; ALUMINUM; ANNEALING; ATOMIC PHYSICS; ATOMIC SPECTROSCOPY; ATOMS; AUGERS; BALLOONS; COPPER; DIFFRACTION; ELECTRON DIFFRACTION; ELECTRON SPECTROSCOPY; ELECTRONS; LOW ENERGY ELECTRON DIFFRACTION; SEGREGATION (METALLOGRAPHY); SELF ASSEMBLED MONOLAYERS; SURFACE SEGREGATION; TWO DIMENSIONAL;

AL CONCENTRATIONS; AL(1 1 1); ALLOY PHASE; ALUMINUM ATOMS; ANNEALING TEMPERATURE; CONCENTRATION; CONCENTRATION OF; DIFFUSION LENGTHS; LOW-ENERGY ELECTRON DIFFRACTIONS; SEGREGATION PHENOMENON;

AUGER ELECTRON SPECTROSCOPY;

EID: 60249099663     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2009.01.014     Document Type: Article

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