ZnO crystals obtained by electrodeposition: Statistical analysis of most important process variables

Thin Solid Films

Volumn 517, Issue 9, 2009, Pages 2859-2864

  Cembrero, Jesus ^a   Busquets Mataix, David ^a  

^a UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

ANOVA; Electrodeposition; Two level factorial design; ZnO morphology

Indexed keywords

ANALYSIS OF VARIANCE (ANOVA); CRYSTALS; ELECTRODEPOSITION; ELECTROLYTES; IMAGE ANALYSIS; MORPHOLOGY; REGRESSION ANALYSIS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; SILICON WAFERS; SURFACE ROUGHNESS; TIN; TITANIUM COMPOUNDS; ZINC OXIDE;

ANOVA; COMPARATIVE STUDIES; COMPUTATIONAL IMAGE ANALYSIS; CONTROL VARIABLES; DIFFERENT SUBSTRATES; ELECTROLYTE CONCENTRATIONS; FACTORIAL ANALYSIS; INDIUM TIN OXIDES; MAIN PROCESS; PROCESS VARIABLES; SCANNING ELECTRONS; STATISTICAL ANALYSIS; SUBSTRATE TYPES; TWO-LEVEL FACTORIAL DESIGN; ZNO CRYSTALS; ZNO MORPHOLOGY;

SUBSTRATES;

EID: 60249092661     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.10.069     Document Type: Article

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