Low-fluence electron yields of highly insulating materials

IEEE Transactions on Plasma Science

Volumn 36, Issue 5 PART 2, 2008, Pages 2238-2245

  Hoffmann, Ryan ^a   Dennison, John R ^a   Thomson, Clint D ^b   Albretsen, Jennifer ^a  

^a UTAH STATE UNIVERSITY   (United States)

^b NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

Charging; Conductivity; Dielectrics; Electric potential; Electron; Electron emission; Emission; Insulators; Materials; Pollution measurement; Surface charging

Indexed keywords

ALUMINA; BUILDING MATERIALS; ELECTRIC POTENTIAL; ELECTRON BEAMS; ELECTRON EMISSION; EMISSION SPECTROSCOPY; MATERIALS; POLYCRYSTALLINE MATERIALS; POLYIMIDES; POLYMERS; SURFACE CHARGE;

CHARGING; CONDUCTIVITY; DIELECTRICS; ELECTRON; EMISSION; INSULATORS; POLLUTION MEASUREMENT; SURFACE CHARGING;

ELECTRONS;

EID: 59749092103     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPS.2008.2004226     Document Type: Article

References (33)

1. J. R. Dennison, R. C. Hoffmann, and J. Abbott, "Triggering threshold spacecraft charging with changes in electron emission from materials," presented at the 45th American Institute Aeronautics and Astronomics Meeting Aerospace Sciences, Reno, NV, 2007, Paper AIAA-2007-1098.
2. M. S. Chung and E. Everhart, "Simple calculation of energy distribution of low-energy secondary electrons emitted from metals under electron bombardment," J. Appl. Phys., vol. 45, no. 2, pp. 707-709, Feb. 1974.
3. M. S. Chung, "Improved calculations of secondary electron energy distributions of metals," J. Appl. Phys., vol. 46, no. 2, pp. 465-466, Jan. 1975.
4. J. Cazaux, "Some considerations on the secondary electron emission δ, form eirradiated insulators," J. Appl. Phys., vol. 85, no. 2, pp. 1137-1147, Jan. 1999.
5. J. Cazaux, "A new model of dependence of secondary electron emission yield on primary electron energy for application to polymers," J. Phys. D, Appl. Phys., vol. 38, no. 14, pp. 2433-2441, Jul. 2005.
6. X. Meyza, D. Goeuriot, C. Guerret-Piecout, D. Treheux, and H.-J. Fitting, "Secondary electron emission and self-consistent charge transport and storage in bulk insulators: Application to alumina," J. Appl. Phys., vol. 94, no. 8, pp. 5384-5392, Oct. 2003.
7. S. Clerc, J. R. Dennison, and C. Thomson, "Importance of accurate computation of secondary electron emission for modeling spacecraft charging," in Proc. 9th Spacecr. Charging Technol. Conf., 2005, pp. 1-6.
8. J. R. Dennison, C. D. Thomson, J. Kite, V. Zavyalov, and J. Corbridge, "Materials characterization at USU: Facilities and knowledge base of electronic properties applicable to spacecraft materials," in Proc. 8th Spacecr. Charging Technol. Conf., Huntsville, AL, 2004.
9. N. E. Nickles, "The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon," Ph.D. dissertation, Utah State Univ., Logan, UT, 2002.
10. C. D. Thomson, "Measurements of secondary electron emission properties of insulators," Ph.D. dissertation, Utah State Univ., Logan, UT, 2004.
11. A. Sim, J. R. Dennison, and C. Thomson, "Effects of incident electron fluence and energy on the electron yield curves and emission spectra of dielectrics," Bull. Amer. Phys. Soc., vol. 50, pt. II, no. 1, pp. 57-61, 2005.
12. N. Nickles, R. E. Davies, and J. R. Dennison, "Applications of secondary electron energy- and angular-distributions to spacecraft charging," in Proc. 8th Spacecr. Charging Technol. Conf.. Hanscom AFB, MA: AFRL Sc. Center, 2000.
13. L. Reimer, Scanning Electron Microscopy. Physics of Image Formation and Microanalysis. New York: Springer-Verlag, 1985, pp. 119-121.
14. E. J. Sternglass, "Secondary electron emission and atomic shell structure," Phys. Rev., vol. 80, no. 5, pp. 925-926, Aug. 1950.
15. E. J. Sternglass, "An experimental investigation of electron back-scattered and secondary electron emission from solids," Ph.D. dissertation, Cornell Univ., Ithaca, NY, 1953.
16. J. R. Young, "Penetration of electrons and ions in aluminum," J. Appl. Phys., vol. 27, no. 1, pp. 1-4, Jan. 1956.
17. A. Melchinger and S. Hofmann, "Dynamic double layer model: Description of time dependent charging phenomena in insulators under electron beam irradiation," J. Appl. Phys., vol. 78, no. 10, pp. 6224-6232, 2003.
18. J. Cazaux, 2005. private communications.
19. J. Cazaux, K. H. Kim, O. Jbara, and G. Salace, "Charging effects of MgO under electron bombardment and nonohmic behavior of the induced specimen current," J. Appl. Phys., vol. 70, no. 2, pp. 960-965, Jul. 1991.
20. J. Cazaux, "Some considerations on the secondary electron emission δ from e-irradiated insulators," J. Appl. Phys., vol. 85, no. 2, pp. 1137-1147, Jan. 1999.
21. J. Cazeaux, "Charging in scanning electron microscopy 'from inside and outside'," Scanning, vol. 26, no. 4, pp. 181-203, Aug. 2004.
22. H. Miyake, Y. Tanaka, and T. Takada, "Characteristic of charge accumulation in glass materials under electron beam irradiation," in Proc. 8th Spacecr. Charging Technol. Conf., Huntsville, AL, 2003.
23. N. Osawa, S. Takahashi, Y. Tanaka, T. Takada, R. Watanabe, N. Tomita, V. Griseri, L. Levy, and C. Laurent, "Measurement of bulk charge in dielectric materials irradiated by electron beam in vacuum environment," in Proc. 8th Spacecr. Charging Technol. Conf., Huntsville, AL, 2003.
24. Y. Usui, T. Sakai, M. Ishikawa, T. Isono, Y. Tanaka, T. Takada, R. Watanabe, N. Tomita, and Y. Murooka, "Measurement of charge distribution in electron beam irradiated PMMA using electro-optical effect," in Proc. 8th Spacecr. Charging Technol. Conf., Huntsville, AL, 2003.
25. T. Takada, "Pulse acoustic technology for measurement of charge distribution in dielectric materials for spacecraft," in Proc. 9th Spacecr. Charging Technol. Conf., Epochal Tsukuba, Japan, 2005.
26. R. E. Davies, "Measurement of angle-resolved secondary electron spectra," Ph.D. dissertation, Utah State Univ., Logan, UT, 1999.
27. W. Y. Chang, J. R. Dennison, J. Kite, and R. E. Davies, "Effects of evolving surface contamination on spacecraft charging," in Proc. 38th Amer. Inst. Aeronaut. Astronom. Meeting Aerosp. Sci., Reno, NV, 2000, pp. 214-216.
28. C. D. Thomson, V. Zavyalov, and J. R. Dennison, "Instrumentation for studies of electron emission and charging from insulators," in Proc. 8th Spacecr. Charging Technol. Conf., Huntsville, AL, 2004.
29. C. D. Thomson, V. Zavyalov, J. R. Dennison, and J. Corbridge, "Electron emission properties of insulator materials pertinent to the international space station," in Proc. 8th Spacecr. Charging Technol. Conf., Huntsville, AL, 2004.
30. N. R. Whetten, "Cleavage in high vacuums of alkali halide single crystals - Secondary electron emission," J. Appl. Phys., vol. 35, no. 11, p. 3279, Nov. 1964.
31. P. H. Dawson, "Secondary electron emission yields of some ceramics," J. Appl. Phys., vol. 35, pp. 3644-3645, Aug. 1966.
32. J. R. Dennison, J. Gillespie, J. Hodges, R. C. Hoffmann, J. Abbott, A. W. Hunt, and R. Spalding, "Radiation induced conductivity of highly-insulating spacecraft materials," in Proc. 10th Spacecr. Charging Technol. Conf., Biarritz, France, Jun. 18-21, 2007.
33. N. W. Green and J. R. Dennison, "Deep dielectric charging of spacecraft polymers by energetic protons," in Proc. 10th Spacecr. Charging Technol. Conf., Biarritz, France, 2007.