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Volumn 54, Issue 7, 2009, Pages 2125-2130

Determination of optimum imaging conditions in AC-SECM using the mathematical distance between approach curves displayed in the impedance domain

Author keywords

AC SECM; Approach curve; Corrosion; Impedance; Scanning electrochemical microscopy; SECM

Indexed keywords

CORROSION; ELECTROCHEMICAL PROPERTIES; MEDICAL IMAGING; PARAMETER ESTIMATION; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SURFACE PROPERTIES;

EID: 59749084496     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2008.08.062     Document Type: Article
Times cited : (11)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.