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Volumn 54, Issue 7, 2009, Pages 2125-2130
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Determination of optimum imaging conditions in AC-SECM using the mathematical distance between approach curves displayed in the impedance domain
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Author keywords
AC SECM; Approach curve; Corrosion; Impedance; Scanning electrochemical microscopy; SECM
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Indexed keywords
CORROSION;
ELECTROCHEMICAL PROPERTIES;
MEDICAL IMAGING;
PARAMETER ESTIMATION;
SCANNING ELECTRON MICROSCOPY;
SCANNING PROBE MICROSCOPY;
SURFACE PROPERTIES;
AC-SECM;
APPROACH CURVE;
IMPEDANCE;
SCANNING ELECTROCHEMICAL MICROSCOPY;
SECM;
SCANNING;
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EID: 59749084496
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/j.electacta.2008.08.062 Document Type: Article |
Times cited : (11)
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References (22)
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