A new out-of-machine calibration technique for passive contact analog probes

Measurement: Journal of the International Measurement Confederation

Volumn 42, Issue 3, 2009, Pages 346-357

  Yagüe, Jośe Antonio ^a   Albajez, Jośe Antonio ^a   Veĺazquez, Jeśus ^a   Aguilar, Juan Jośe ^a  

^a UNIVERSITY OF ZARAGOZA   (Spain)

Author keywords

Calibration technique; CMM; Kinematic coupling; Passive contact analog probe

Indexed keywords

CALIBRATION; COORDINATE MEASURING MACHINES; COUPLINGS; KINEMATICS; MACHINE COMPONENTS; MECHANICS; MICROMETERS; SCANNING; THICKNESS MEASUREMENT;

CALIBRATION SYSTEMS; CALIBRATION TECHNIQUE; CMM; CONTACT PROBES; ERROR SOURCES; FAST MEASUREMENTS; INSPECTION TASKS; KINEMATIC COUPLING; MACHINE SCANNING; OPTIMISATION; PASSIVE CONTACT ANALOG PROBE; PRECISION EQUIPMENTS; PROBING SYSTEMS; PRODUCTION CYCLES; STATIC ERRORS; SUB MICROMETERS; SUB-SYSTEMS;

PROBES;

EID: 59649106780     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2008.07.006     Document Type: Article

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