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Volumn 11, Issue 2, 2009, Pages 305-309
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La16[Si8N22][SiON3] 2 - A nitridosilicate with isolated, corner-sharing and edge-sharing tetrahedra
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Author keywords
Chain silicate; Oxonitridosilicate; Rietveld refinement; Structure determination
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Indexed keywords
CRYSTAL STRUCTURE;
DIFFRACTION;
LANTHANUM;
OPTICAL COMMUNICATION;
RIETVELD METHOD;
SILICATES;
SILICON;
SILICON COMPOUNDS;
SILICON NITRIDE;
SYNTHESIS (CHEMICAL);
%MOISTURE;
CHAIN SILICATE;
DIIMIDE;
EDGE-SHARING;
INDEPENDENT REFLECTIONS;
INFINITE CHAINS;
LOW DEGREES;
MIXED ANIONS;
NITROGEN ATOMS;
OXONITRIDOSILICATE;
RADIOFREQUENCY FURNACES;
STRUCTURE DETERMINATION;
X- RAY DIFFRACTIONS;
X-RAY POWDER DIFFRACTIONS;
X-RAY STRUCTURES;
RIETVELD REFINEMENT;
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EID: 59349121147
PISSN: 12932558
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solidstatesciences.2008.08.008 Document Type: Article |
Times cited : (20)
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References (45)
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