Structural and chemical analyses of sputtered InxSy buffer layers in Cu(In,Ga)Se2 thin-film solar cells

Thin Solid Films

Volumn 517, Issue 8, 2009, Pages 2792-2798

  Abou Ras, D ^a   Kostorz, G ^a   Hariskos, D ^b   Menner, R ^b   Powalla, M ^b   Schorr, S ^c   Tiwari, A N ^a,d  

^a ETH ZURICH   (Switzerland)

^b ZENTRUM FÜR SONNENENERGIE UND WASSERSTOFF FORSCHUNG BADEN WÜRTTEMBERG ZSW   (Germany)

^c FREIE UNIVERSITÄT BERLIN   (Germany)

^d LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

Buffer; Cu(In, Ga)Se2; Indium sulfide; Sputtered; Transmission electron microscopy

Indexed keywords

BOROSILICATE GLASS; COPPER; ELECTRODEPOSITION; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; GALLIUM; GALLIUM ALLOYS; INDIUM; PHOTOVOLTAIC CELLS; SOLAR CELLS; SOLAR ENERGY; SOLAR EQUIPMENT; SULFUR; TRANSMISSION ELECTRON MICROSCOPY;

ABSORPTION EDGES; BUFFER; CU(IN, GA)SE2; ELEVATED TEMPERATURES; INDIUM SULFIDE; INTER DIFFUSIONS; OPTICAL TRANSMISSIONS; REFLECTION MEASUREMENTS; SCANNING AND TRANSMISSION ELECTRON MICROSCOPIES; SPUTTERED; SUBSTRATE TEMPERATURES; SULFUR CONCENTRATIONS; THIN-FILM SOLAR CELLS; X- RAY DIFFRACTIONS; X-RAY SPECTROMETRIES;

SUBSTRATES;

EID: 59349108988     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.10.138     Document Type: Article

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