Hydrogen-induced degradation in SrTiO3-based grain boundary barrier layer ceramic capacitors

Ceramics International

Volumn 35, Issue 3, 2009, Pages 953-956

  Shen, Z J ^a   Chen, W P ^a,b   Zhu, K ^a   Zhuang, Y ^c   Hu, Y M ^b   Wang, Y ^b   Chan, H L W ^b  

^a BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^c Guangzhou Sunrise Electronic Corporation (Ltd)   (China)

Author keywords

B. Failure analysis; C. Dielectric properties; D. BaTiO3 and titanates; E. Capacitors

Indexed keywords

CAPACITANCE; CAPACITORS; CERAMIC MATERIALS; DEGRADATION; DIELECTRIC DEVICES; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; ELECTROCHEMICAL ELECTRODES; ELECTROLYTIC CAPACITORS; FAILURE ANALYSIS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; HYDROGEN; NONMETALS; QUALITY ASSURANCE; RELIABILITY; SAFETY FACTOR; STRONTIUM ALLOYS; TITANIUM;

ATOMIC HYDROGENS; B. FAILURE ANALYSIS; C. DIELECTRIC PROPERTIES; D. BATIO3 AND TITANATES; E. CAPACITORS; ELECTROCHEMICAL HYDROGEN CHARGING; FREQUENCY RANGES; GRAIN BOUNDARY LAYERS; GRAIN-BOUNDARY BARRIERS; HYDROGEN-INDUCED DEGRADATIONS; NAOH SOLUTIONS; ORDERS OF MAGNITUDES; REDUCTION REACTIONS;

CERAMIC CAPACITORS;

EID: 59349104455     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2008.04.005     Document Type: Article

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