Determination of charge-carrier mobility in organic light-emitting diodes by impedance spectroscopy in presence of localized states

Japanese Journal of Applied Physics

Volumn 47, Issue 12, 2008, Pages 8965-8972

  Okachi, Takayuki ^a   Nagase, Takashi ^a   Kobayashi, Takashi ^a   Naito, Hiroyoshi ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

Charge carrier mobility; Impedance spectroscopy; Localized state distributions; Lumation ; Organic light emitting diodes

Indexed keywords

BIODEGRADABLE POLYMERS; CAPACITANCE; CHARGE CARRIERS; CIVIL AVIATION; CONDUCTING POLYMERS; CURRENT DENSITY; DIODES; IMAGE SEGMENTATION; LIGHT EMISSION; LIGHT EMITTING DIODES; ORGANIC LIGHT EMITTING DIODES (OLED); PROGRAMMING THEORY;

CHARACTERISTIC TEMPERATURES; CHARGE-CARRIER MOBILITY; DRIFT MOBILITIES; IMPEDANCE SPECTROSCOPY; INJECTION SPACES; LIGHT-EMITTING POLYMERS; LOCALIZED STATE; LOCALIZED-STATE DISTRIBUTIONS; LOW FREQUENCY BEHAVIORS; ORGANIC LIGHT-EMITTING DIODES; POLYFLUORENE; VALENCE-BAND;

CARRIER MOBILITY;

EID: 59349087617     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.8965     Document Type: Article

References (36)

1. K. C. Kao and W. Hwang: Electrical Transport in Solids (Pergamon Press, Oxford, U.K., 1981).
2. P. W. M. Blom, M. J. M. de Jong, and S. Breedijk: Appl. Phys. Lett. 71 (1997) 930.
3. M. Redecker, D. D. C. Bradley, M. Inbasekaran, and E. P. Woo: Appl. Phys. Lett. 74 (1999) 1400.
4. D. Poplavskyy, J. Nelson, and D. D. C. Bradley: Appl. Phys. Lett. 83 (2003) 707.
5. D. Poplavskyy and J. Nelson: J. Appl. Phys. 93 (2003) 341.
6. D. Poplavskyy, W. Su, and F. So: J. Appl. Phys. 98 (2005) 014501.
7. R. U. A. Khan, D. D. C. Bradley, M. A. Webster, J. L. Auld, and A. B. Walker: Appl. Phys. Lett. 84 (2004) 921.
8. H. Azuma, K. Asada, T. Kobayashi, and H. Naito: Thin Solid Films 509 (2006) 182.
9. S. Karg, W. Riess, V. Dyakonov, and M. Schwoerer: Synth. Met. 54 (1993) 427.
10. H. C. F. Martens, H. B. Brom, and P. W. M. Blom: Phys. Rev. B 60 (1999) R8489.
11. H. C. F. Martens, J. N. Huiberts, and P. W. M. Blom.: Appl. Phys. Lett. 77 (2000) 1852.
12. H. C. F. Martens, W. F. Pasveer, H. B. Brom, J. N. Huiberts, and P. W. M. Blom.: Phys. Rev. B 63 (2001) 125328.
13. S. Berleb and W. Brütting: Phys. Rev. Lett. 89 (2002) 286601.
14. H. Azuma, T. Okachi, N. Watanabe, T. Kobayashi, and H. Naito: Proc. 12th Int. Display Workshops in Conjunction with Asia Display, 2005, p. 757.
15. T. Okachi, T. Nagase, T. Kobayashi, and H. Naito: Thin Solid Films (2008) [DOI: 10.1016/j.tsf.2008.09.019].
16. S. W. Tsang, S. K. So, and J. B. Xu: J. Appl. Phys. 99 (2006) 013706.
17. D. Poplavskyy and F. So: J. Appl. Phys. 99 (2006) 033707.
18. The details will be published in a forthcoming paper by current authors.
19. J. Shao and G. T. Wright: Solid-State Electron. 3 (1961) 291.
20. We have examined the influence of charge carrier diffusion on mobility determination by the device simulator and find that the mobility is correctly determined even in the presence of carrier diffusion.
21. T. Okachi, T. Nagase, T. Kobayashi, and H. Naito: Thin Solid Films (2008) [DOI: 10.1016/j.tsf.2008.09.020].
22. M. Schmeits: J. Appl. Phys. 101 (2007) 084508.
23. H. H. P. Gommans, M. Kemerink, G. G. Andersson, and R. M. T. Pijper: Phys. Rev. B 69 (2004) 155216.
24. D. Dascalu: Int. J. Electron. 21 (1966) 183.
25. R. Kassing: Phys. Status Solidi A 28 (1975) 107.
26. H. Meyer, D. Haarer, H. Naarmann, and H. H. Horhold: Phys. Rev. B 52 (1995) 2587.
27. P. W. M. Blom, M. J. M. de Jong, and J. J. M. Vleggaar: Appl. Phys. Lett. 68 (1996) 3308.
28. M. Pope and C. E. Swenberg: Electronic Processes in Organic Crystals and Polymers (Oxford University Press, New York, 1999) 2nd ed., p. 616.
29. H. Bässler: Phys. Status Solidi B 175 (1993) 15.
30. In principle, TOF measurements for thin-film samples with thicknesses less than 1 μm are possible but photocarriers are almost homogeneously created throughout samples and thereby electron and hole transport cannot be distinguished. In addition, observed waveforms of TOF transients are different from the conventional TOF waveforms. We have discussed this issue in the following article. T. Yoshikawa, T. Nagase, T. Kobayashi, S. Murakami, and H. Naito: Thin Solid Films 516 (2008) 2595.
31. J. Noolandi: Phys. Rev. B 16 (1977) 4466.
32. H. Naito, J. Ding, and M. Okuda: Appl. Phys. Lett. 64 (1994) 1830.
33. T. Nagase and H. Naito: Denki Gakkai Ronbunshi A 118 (1998) 1446 [in Japanese].
34. F. So, B. Krummacher, M. K. Mathai, D. Poplavskyy, S. A. Choulis, and V. E. Choong: J. Appl. Phys. 102 (2007) 091101.
35. T. Tiedje and A. Rose: Solid State Commun. 37 (1981) 49.
36. V. I. Arkhipov, V. A. Kolesnikov, and A. I. Rudenko: J. Phys. D 17 (1984) 1241.