The use of X-ray crystallography to determine absolute configuration (II)

Acta Chimica Slovenica

Volumn 55, Issue 4, 2008, Pages 689-691

  Flack, Howard D ^a  

^a UNIVERSITY OF GENEVA   (Switzerland)

Author keywords

Absolute configuration; Absolute structure; Crystal structure; Resonant scattering; X ray crystallography

Indexed keywords

EID: 59249090277     PISSN: 13180207     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

References (7)

1. S. Allenmark, J. Gawronski, N. Berova, (Editors), Chirality, 2008, 20, 606-759.
2. H. D. Flack, G. Bernardinelli, Chirality, 2008, 20, 681-690.
3. H. D. Flack, U. Shmueli, Acta Cryst., 2007, A63, 257-265.
4. U. Shmueli, M. Schiltz, H. D. Flack, Acta Cryst., 2008, A64, 476-483.
5. H. D. Flack, G. Bernardinelli, Acta Cryst., 2008, A64, 484-493.
6. H. D. Flack, Helvetica Chimica Acta, 2005, 86, 905-921.
7. M. Hostettler, H. D. Flack, Acta Cryst. 2003, B59, 537-538.