The use of X-ray crystallography to determine absolute configuration

Chirality

Volumn 20, Issue 5, 2008, Pages 681-690

  Flack, H D ^a,b   Bernardinelli, G ^a  

^a UNIVERSITY OF GENEVA   (Switzerland)

^b Laboratoire de Cristallographie   (Switzerland)

Author keywords

Absolute structure; Crystal structure; Resonant scattering

Indexed keywords

CHIRALITY; CRYSTAL STRUCTURE; ENANTIOSELECTIVITY; OPTICAL ROTATION; PRIORITY JOURNAL; REVIEW; SOLID STATE; STRUCTURE ANALYSIS; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION;

EID: 43249092579     PISSN: 08990042     EISSN: 1520636X     Source Type: Journal    
DOI: 10.1002/chir.20473     Document Type: Review

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