Applications and properties of the Bijvoet intensity ratio

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 64, Issue 4, 2008, Pages 484-493

  Flack, H D ^a   Bernardinelli, G ^a  

^a UNIVERSITY OF GENEVA   (Switzerland)

Author keywords

Absolute configuration; Absolute structure; Anomalous scattering; Bijvoet intensity ratio; Flack parameter; Friedel's law; Intensity statistics; Resonant scattering

Indexed keywords

ALGORITHM; ARTICLE; COMPUTER PROGRAM; RADIATION SCATTERING; REPRODUCIBILITY; X RAY CRYSTALLOGRAPHY;

ALGORITHMS; CRYSTALLOGRAPHY, X-RAY; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SOFTWARE;

EID: 47349089663     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S0108767308013780     Document Type: Article

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