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Volumn , Issue , 2000, Pages 454-457

Cu(InAl)Se2 thin films and devices deposited by multisource evaporation

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; EFFICIENCY; ENERGY GAP; EVAPORATION; OPTICAL LATTICES; SELENIUM COMPOUNDS; SEMICONDUCTING SELENIUM COMPOUNDS; X RAY DIFFRACTION;

EID: 84949557482     PISSN: 01608371     EISSN: None     Source Type: Journal    
DOI: 10.1109/PVSC.2000.915868     Document Type: Article
Times cited : (14)

References (9)
  • 9
    • 84867865853 scopus 로고    scopus 로고
    • Joint Committee on Powder Diffraction Standards, Pennsylvania
    • Powder Diffraction Files, Ed. F. McClune (Joint Committee on Powder Diffraction Standards, Pennsylvania, 1997).
    • (1997) Powder Diffraction Files
    • McClune, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.