Screen charge transfer by grounded tip on ferroelectric surfaces

Physica Status Solidi - Rapid Research Letters

Volumn 2, Issue 2, 2008, Pages 74-76

  Kim, Yunseok ^a   Kim, Jiyoon ^a   Bühlmann, Simon ^b   Hong, Seungbum ^c   Kim, Yong Kwan ^b   Kim, Seung Hyun ^d   No, Kwangsoo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d INOSTEK Inc   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC SURFACES; KELVIN FORCE MICROSCOPY; PIEZOELECTRIC FORCE MICROSCOPY; POLARIZATION REVERSALS; SCREEN CHARGES;

CHARGE TRANSFER; FERROELECTRIC THIN FILMS; FERROELECTRICITY; ION EXCHANGE; MASS TRANSFER; POLARIZATION;

FERROELECTRIC FILMS;

EID: 58849160808     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.200701265     Document Type: Article

References (16)

1. Y. Cho et al., Appl. Phys. Lett. 81, 4401 (2002).
2. A. Gruverman et al., Appl. Phys. Lett. 87, 082902 (2005).
3. S. V. Kalinin and D. A. Bonnell, Nano Lett. 4, 555 (2004).
4. Y. Kim et al., J. Electroceram. 17, 185 (2006).
5. X. Q. Chen et al., J. Vac. Sci. Technol. B 17, 1930 (1999).
6. M. Aplanalp et al., Phys. Rev. Lett. 86, 5799 (2001).
7. S. Buhlmann et al., Phys. Rev. B 72, 214120 (2005).
8. T. Morita and Y. Cho, Appl. Phys. Lett. 84, 257 (2004).
9. Y. Cho et al., Appl. Phys. Lett. 87, 232907 (2005).
10. Y. Kim et al., Appl. Phys. Lett. 89, 172906 (2006).
11. Y. Kim et al., Appl. Phys. Lett. 90, 072910 (2007).
12. A. L. Kholkin et al., Nanotechnology 18, 095502 (2007).
13. M. Katoh et al., Integr. Ferroelectr. 68, 207 (2004).
14. S. V. Kalinin and D. A. Bonnell, Phys. Rev. B 63, 125411 (2001).
15. J. Woo et al., J. Vac. Sci. Technol. 19, 818 (2001).
16. Y. Kim et al., Appl. Phys. Lett. 91, 052906 (2007).