|
Volumn 603, Issue 3, 2009, Pages 566-570
|
Stable surface termination on vicinal 6H-SiC(0 0 0 1) surfaces
|
Author keywords
Low energy electron diffraction; Silicon carbide; Step formation and bunching
|
Indexed keywords
BALLOONS;
DIFFRACTION;
LOW ENERGY ELECTRON DIFFRACTION;
MODEL STRUCTURES;
NITRIDES;
SCANNING TUNNELING MICROSCOPY;
SILICON CARBIDE;
SILICON NITRIDE;
SULFUR COMPOUNDS;
ENERGY ELECTRON DIFFRACTION;
SIC(0 0 0 1);
SILICON OXYNITRIDE (SION);
STEP FORMATION AND BUNCHING;
UNIT CELLS;
ELECTRON DIFFRACTION;
|
EID: 58749105615
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2008.12.025 Document Type: Article |
Times cited : (14)
|
References (16)
|