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Volumn 64, Issue 2, 2009, Pages 167-172

Using the van der Waals broadening of spectral atomic lines to measure the gas temperature of an argon-helium microwave plasma at atmospheric pressure

Author keywords

Atmospheric pressure; Atomic spectral lines; Gas mixtures; Gas temperature; Microwave discharges; Plasma spectroscopy; van der Waals broadening

Indexed keywords

ARGON; ATMOSPHERIC CHEMISTRY; ATMOSPHERIC PRESSURE; ATMOSPHERIC TEMPERATURE; ATMOSPHERICS; ATOMIC PHYSICS; ATOMIC SPECTROSCOPY; ATOMS; ELECTRIC DISCHARGES; EMISSION SPECTROSCOPY; GAS MIXTURES; GASES; HELIUM; INERT GASES; LEAKAGE (FLUID); MICROWAVES; MIXTURES; PLASMAS; PRESSURE; REACTION RATES; SPECTRUM ANALYSIS; TECHNOLOGY TRANSFER; VAN DER WAALS FORCES;

EID: 58649105095     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2008.11.006     Document Type: Article
Times cited : (44)

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