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Volumn 3094, Issue , 1997, Pages 288-294
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Ellipsometry for correctly determining the void fraction and true refractive index of thin films
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Author keywords
Adsorption; Attachment; Condensed water; Effective media; Pore; True refractive index; Vacuum; Void fraction
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Indexed keywords
ADSORPTION;
DEWATERING;
ELLIPSOMETRY;
ENERGY ABSORPTION;
HAFNIUM COMPOUNDS;
LIGHT REFRACTION;
POLARIMETERS;
REFRACTIVE INDEX;
REFRACTOMETERS;
SILICON COMPOUNDS;
VACUUM;
ATTACHMENT;
CONDENSED WATER;
EFFECTIVE MEDIA;
PORE;
TRUE REFRACTIVE INDEX;
VOID FRACTION;
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EID: 58649103958
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.271828 Document Type: Conference Paper |
Times cited : (6)
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References (9)
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