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Volumn 3094, Issue , 1997, Pages 288-294

Ellipsometry for correctly determining the void fraction and true refractive index of thin films

Author keywords

Adsorption; Attachment; Condensed water; Effective media; Pore; True refractive index; Vacuum; Void fraction

Indexed keywords

ADSORPTION; DEWATERING; ELLIPSOMETRY; ENERGY ABSORPTION; HAFNIUM COMPOUNDS; LIGHT REFRACTION; POLARIMETERS; REFRACTIVE INDEX; REFRACTOMETERS; SILICON COMPOUNDS; VACUUM;

EID: 58649103958     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.271828     Document Type: Conference Paper
Times cited : (6)

References (9)
  • 1
    • 0344957109 scopus 로고
    • The Adsorption of Gases and Vapors
    • Princeton University Press, Princeton,N.J
    • S.Brunauer."The Adsorption of Gases and Vapors",Physical Adsorption,Vol.1, Princeton University Press, Princeton,N.J.,1945.
    • (1945) Physical Adsorption , vol.1
    • Brunauer, S.1
  • 2
    • 0344251493 scopus 로고
    • Thickness- dependent void fraction of rf-sputtered amorphous Ge films by spectroscopic ellipsometry
    • P.P.J.McMarr,J.R.Blanco,K.Vedam,R.Messjer, and L.Pilione,"Thickness- dependent void fraction of rf-sputtered amorphous Ge films by spectroscopic ellipsometry," Appl.Phys.Lett, Vol.49 (6), 328-330 (1986).
    • (1986) Appl.Phys.Lett , vol.49 , Issue.6 , pp. 328-330
    • McMarr, P.P.J.1    Blanco, J.R.2    Vedam, K.3    Messjer, R.4    Pilione, L.5
  • 3
    • 0027061603 scopus 로고    scopus 로고
    • J.A.Woollam , P.G.Snyder, Yao H, B.Johs In-situ and ex-situ ellipsometric characterization for semiconductor technology, Proc.SPIE., 1678, 246-257 (1992).
    • J.A.Woollam , P.G.Snyder, Yao H, B.Johs "In-situ and ex-situ ellipsometric characterization for semiconductor technology," Proc.SPIE., Vol.1678, 246-257 (1992).
  • 4
    • 84940825026 scopus 로고
    • The Accurate Determination of Optical Properties by Ellipsometry
    • E.D.Palik,ed.,Academic Press, Orlando,FL
    • D.E.Aspnes, "The Accurate Determination of Optical Properties by Ellipsometry" , in Handbook of Optical Constants of Solids .,E.D.Palik,ed.,Academic Press, Orlando,FL, 1985 .
    • (1985) Handbook of Optical Constants of Solids
    • Aspnes, D.E.1
  • 5
    • 0042174700 scopus 로고
    • Determining the porosity and true index of refraction of thin films by ellipsometry
    • May
    • V.A.Tolmachiev, M.A.Okatov, and E.F.Matsoian, "Determining the porosity and true index of refraction of thin films by ellipsometry", Sov. J. Opt. Technol., 60(5) 327-329 May (1993).
    • (1993) Sov. J. Opt. Technol , vol.60 , Issue.5 , pp. 327-329
    • Tolmachiev, V.A.1    Okatov, M.A.2    Matsoian, E.F.3
  • 7
    • 0344683018 scopus 로고
    • Adsorption-ellipsometric method for determining optical constant of thin porous films
    • K.KSvitashev and A.S.Mardejov,ed.,Nauka, Novosibirsk, p
    • V.A.Tolmachev,M.A.Okatov, and T.V.Leonova "Adsorption-ellipsometric method for determining optical constant of thin porous films", in Ellipsometry: Theory, Methods, and Applications. K.KSvitashev and A.S.Mardejov,ed.,Nauka, Novosibirsk,1991,252. p.
    • (1991) Ellipsometry: Theory, Methods, and Applications , pp. 252
    • Tolmachev, V.A.1    Okatov, M.A.2    Leonova, T.V.3
  • 8
    • 0001367758 scopus 로고    scopus 로고
    • V.A.Tolmachev and E.A.Konshina, Ellipsometric study of a-C:H films, Diamond and Related Materials,1996 (to be publ.).
    • V.A.Tolmachev and E.A.Konshina, "Ellipsometric study of a-C:H films," Diamond and Related Materials,1996 (to be publ.).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.