Transport properties and lithium insertion study in the p-type semi-conductors AgCuO2 and AgCu0.5Mn0.5O2

Journal of Solid State Chemistry

Volumn 182, Issue 2, 2009, Pages 374-380

  Sauvage, F ^a   Munoz Rojas D ^b   Poeppelmeier, K R ^a   Casan Pastor N ^b  

^a NORTHWESTERN UNIVERSITY   (United States)

^b INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

Author keywords

Delafossite; In situ XRD; Lithium batteries; p Type semi conductors; Silver copper mixed oxides

Indexed keywords

AMORPHIZATION; COPPER; COPPER COMPOUNDS; COPPER OXIDES; CRYSTALLIZATION; LITHIUM BATTERIES; MAGNETIC DOMAINS; MANGANESE; MANGANESE COMPOUNDS; SEEBECK COEFFICIENT; SEMICONDUCTOR MATERIALS; SILVER; SOLID SOLUTIONS; SOLIDIFICATION; SUBSTITUTION REACTIONS; TRANSPORT PROPERTIES; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

DC MEASUREMENTS; DELAFOSSITE; DISPLACEMENT REACTIONS; HIGH CONDUCTIVITY; IN SITU XRD; IN-SITU; LITHIUM INSERTION; LITHIUM INSERTION MECHANISMS; P TYPE CONDUCTIVITIES; P-TYPE SEMI-CONDUCTORS; POTENTIAL RANGING; SILVER METAL; SILVER-COPPER MIXED OXIDES; VALENCE STATES;

LITHIUM;

EID: 58549083106     PISSN: 00224596     EISSN: 1095726X     Source Type: Journal    
DOI: 10.1016/j.jssc.2008.10.038     Document Type: Article

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