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Journal of Materials Science

Volumn 44, Issue 2, 2009, Pages 534-540

Structural, dielectric, and electrical studies on thermally evaporated CdTe thin films

(3) Tewari, S a Bhattacharjee, A a Sahay, P P b

a NATIONAL INSTITUTE OF TECHNOLOGY SILCHAR (India)

b MOTILAL NEHRU NATIONAL INSTITUTE OF TECHNOLOGY (India)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM; CADMIUM ALLOYS; CADMIUM COMPOUNDS; CERAMIC CAPACITORS; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC NETWORK ANALYSIS; POLYMER BLENDS; SILVER; SOLIDS; TELLURIUM COMPOUNDS; THERMAL EVAPORATION; THIN FILMS; VACUUM EVAPORATION; X RAY ANALYSIS;

A.C. CONDUCTIVITIES; AG ELECTRODES; CADMIUM TELLURIDES; COMPLEX IMPEDANCE MEASUREMENTS; CORRELATED BARRIER HOPPING; DIELECTRIC CONSTANTS; EFFECT OF TEMPERATURES; ELECTRICAL AND DIELECTRIC PROPERTIES; ELECTRICAL STUDIES; EXPERIMENTAL STUDIES; RELAXATION BEHAVIORS; STRUCTURAL CHARACTERIZATIONS; TRANSPORT BEHAVIORS; X-RAY DIFFRACTIONS;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 58349116605 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-008-3088-x Document Type: Article

Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.