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Volumn 94, Issue 2, 2009, Pages

Growth and characterization of stable SrO-terminated SrTiO3 surfaces

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROSCOPY; DIFFRACTION; EMISSION SPECTROSCOPY; EPITAXIAL FILMS; GROWTH (MATERIALS); HIGH ENERGY ELECTRON DIFFRACTION; PULSED LASER APPLICATIONS; PULSED LASER DEPOSITION; SURFACE PROPERTIES; VACUUM;

EID: 58349099472     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3052606     Document Type: Article
Times cited : (36)

References (25)
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    • Clear evidence that the maximum of diffracted intensity does not guarantee layer completion was provided, e.g., by, 0031-9007 10.1103/PhysRevLett.96.226104, () (by resorting to an x ray probe, but the same may be expected for RHEED).
    • Clear evidence that the maximum of diffracted intensity does not guarantee layer completion was provided, e.g., by J. Z. Tischler, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.96.226104 96, 226104 (2006) (by resorting to an x ray probe, but the same may be expected for RHEED).
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    • The different reactivity of A -site and B -site surfaces with water is just the principle on which the selective etchings are based. See also, 1742-6588 10.1088/1742-6596/93/1/012001.
    • The different reactivity of A -site and B -site surfaces with water is just the principle on which the selective etchings are based. See also R. A. Evarestov, J. Phys.: Conf. Ser. 1742-6588 10.1088/1742-6596/93/1/012001 93, 012001 (2007).
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  • 21
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    • The STO surface presents a large variety of reconstructions, depending on the preparation. The (2×1) reconstruction is described, for instance, by, 0163-1829 10.1103/PhysRevB.70.085415.
    • The STO surface presents a large variety of reconstructions, depending on the preparation. The p (2×1) reconstruction is described, for instance, by K. Johnston, M. R. Castell, A. T. Paxton, and M. W. Finnis, Phys. Rev. B 0163-1829 10.1103/PhysRevB.70.085415 70, 085415 (2004).
    • (2004) Phys. Rev. B , vol.70 , pp. 085415
    • Johnston, K.1    Castell, M.R.2    Paxton, A.T.3    Finnis, M.W.4
  • 22
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    • Some authors [see, 0921-4534 10.1016/S0921-4534(00)01616-6, () for a brief review] reported on a single SrO termination of their homoepitaxial STO films. This is not the case for our samples.
    • Some authors [see J. M. Huijbregtse, J. H. Rector, and B. Dam, Physica C 0921-4534 10.1016/S0921-4534(00)01616-6 351, 183 (2001) for a brief review] reported on a single SrO termination of their homoepitaxial STO films. This is not the case for our samples.
    • (2001) Physica C , vol.351 , pp. 183
    • Huijbregtse, J.M.1    Rector, J.H.2    Dam, B.3
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    • The intensity is evaluated after Shirley background subtraction by curve fitting. Mean free path are computed according to, 0142-2421 10.1002/sia.740010103, (); For computations details, see, e.g., Phys. Rev. B 0163-1829 10.1103/PhysRevB.59.13453 59, 13453 (1999).
    • The intensity is evaluated after Shirley background subtraction by curve fitting. Mean free path are computed according to M. P. Seah and W. A. Dench, Surf. Interface Anal. 0142-2421 10.1002/sia.740010103 1, 2 (1979); For computations details, see, e.g., J. Choi, J. Zhang, S.-H. Liou, P. A. Dowben, and E. W. Plummer, Phys. Rev. B 0163-1829 10.1103/PhysRevB.59.13453 59, 13453 (1999).
    • (1979) Surf. Interface Anal. , vol.1 , pp. 2
    • Seah, M.P.1    Dench, W.A.2    Choi, J.3    Zhang, J.4    Liou, S.-H.5    Dowben, P.A.6    Plummer, E.W.7
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