Deposition and characterization of few-nanometers-thick superconducting Mo-Re films

Superconductor Science and Technology

Volumn 21, Issue 11, 2008, Pages

  Seleznev, V A ^a   Tarkhov, M A ^a   Voronov, B M ^a   Milostnaya, I I ^a   Lyakhno, V Yu ^b   Garbuz, A S ^b   Mikhailov, M Yu ^b   Zhigalina, O M ^c   Gol'Tsman, G N ^a  

^a MOSCOW STATE PEDAGOGICAL UNIVERSITY   (Russian Federation)

^b B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

^c SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; ATOMIC SPECTROSCOPY; CORUNDUM; ELECTRIC CONDUCTIVITY; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INERT GASES; MOLYBDENUM; OXYGEN; PHOTOELECTRON SPECTROSCOPY; PHOTONS; RHENIUM; SUPERCONDUCTIVITY; X RAY PHOTOELECTRON SPECTROSCOPY;

ALLOY TARGETS; ATOM RATIOS; CRITICAL TEMPERATURES; HIGH RESOLUTIONS; HOMOGENEOUS STRUCTURES; OXYGEN CONCENTRATIONS; SAPPHIRE SUBSTRATES; SUPERCONDUCTING DETECTORS; X-RAY PHOTOELECTRON SPECTROSCOPIES;

SUPERCONDUCTING FILMS;

EID: 58149510596     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/21/11/115006     Document Type: Article

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