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Volumn 280, Issue 1-3, 2009, Pages 26-31

Electron impact ionization of CCl4 and SF6 embedded in superfluid helium droplets

Author keywords

CCl4; Helium droplets; Soft ionization

Indexed keywords


EID: 58149486645     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2008.07.009     Document Type: Article
Times cited : (15)

References (39)
  • 25
    • 58149526693 scopus 로고    scopus 로고
    • 4 will be the subject of an upcoming study.
    • 4 will be the subject of an upcoming study.
  • 29
    • 58149502510 scopus 로고    scopus 로고
    • NIST Chemistry WebBook. http://webbook.nist.gov/chemistry/.
    • NIST Chemistry WebBook. http://webbook.nist.gov/chemistry/.
  • 39
    • 58149517621 scopus 로고    scopus 로고
    • H. Schöbel et al., submitted for publication.
    • H. Schöbel et al., submitted for publication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.