Electron impact ionization of CCl4 and SF6 embedded in superfluid helium droplets

International Journal of Mass Spectrometry

Volumn 280, Issue 1-3, 2009, Pages 26-31

  Schöbel, Harald ^a   Dampc, Marcin ^b   da Silva, Filipe Ferreira ^a   Mauracher, Andreas ^a   Zappa, Fabio ^a   Denifl, Stephan ^a   Märk, Tilmann D ^a   Scheier, Paul ^a  

^a UNIVERSITY OF INNSBRUCK   (Austria)

^b GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

CCl4; Helium droplets; Soft ionization

Indexed keywords

EID: 58149486645     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2008.07.009     Document Type: Article

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