Mass spectrometric investigation of anions formed upon free electron attachment to nucleobase molecules and clusters embedded in superfluid helium droplets

Physical Review Letters

Volumn 97, Issue 4, 2006, Pages

  Denifl, Stephan ^a   Zappa, Fabio ^a   Mähr, Ingo ^a   Lecointre, Julien ^a   Probst, Michael ^a   Märk, Tilmann D ^a   Scheier, Paul ^a  

^a UNIVERSITY OF INNSBRUCK   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

DISSOCIATION; DROP FORMATION; ELECTRONS; MASS SPECTROMETRY; NEGATIVE IONS;

FREE ELECTRON ATTACHMENT; HELIUM CLUSTERS; LOW ENERGY ELECTRON PENETRATION; NUCLEOBASE MOLECULES;

SUPERFLUID HELIUM;

EID: 33746546207     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.97.043201     Document Type: Article

References (21)

1. L. Sanche, Eur. Phys. J. D 35, 367 (2005), and references therein. EPJDF6 1434-6060 10.1140/epjd/e2005-00206-6
2. B. Boudaiffa, P. Cloutier, D. Hunting, M.A. Huels, and L. Sanche, Science 287, 1658 (2000). SCIEAS 0036-8075 10.1126/science.287.5458.1658
3. F. Martin, P.D. Burrow, Z. Cai, P. Cloutier, D. Hunting, and L. Sanche, Phys. Rev. Lett. 93, 068101 (2004). PRLTAO 0031-9007 10.1103/PhysRevLett.93. 068101
4. S. Ptasinska, S. Denifl, S. Gohlke, P. Scheier, E. Illenberger, and T.D. Märk, Angew. Chem., Int. Ed. ACIEF5 1433-7851 45, 1893 (2006). 10.1002/anie.200503930
5. J.P. Toennies and A.F. Vilesov, Angew. Chem., Int. Ed. ACIEF5 1433-7851 43, 2622 (2004), and references therein. 10.1002/anie.200300611
6. J.A. Northby, J. Chem. Phys. 115, 10065 (2001), and references therein. JCPSA6 0021-9606 10.1063/1.1418249
7. U. Henne and J.P. Toennies, J. Chem. Phys. 108, 9327 (1998). JCPSA6 0021-9606 10.1063/1.476385
8. M. Farnik and J.P. Toennies, J. Chem. Phys. 118, 4176 (2003). JCPSA6 0021-9606 10.1063/1.1539851
9. K. Gluch, J. Fedor, S. Matt-Leubner, O. Echt, A. Stamatovic, M. Probst, P. Scheier, and T.D. Märk, J. Chem. Phys. 118, 3090 (2003). JCPSA6 0021-9606 10.1063/1.1536978
10. S. Denifl, M. Stano, A. Stamatovic, P. Scheier, and T.D.Märk, J. Chem. Phys. 124, 054320 (2006). JCPSA6 0021-9606 10.1063/1.2163346
11. L.G. Christophorou and J.K. Olthoff, Int. J. Mass Spectrom. IMSPF8 1387-3806 205, 27 (2001). 10.1016/S1387-3806(00)00280-3
12. S. Denifl, S. Ptasinska, M. Probst, J. Hrusak, P. Scheier, and T.D. Märk, J. Phys. Chem. A 108, 6562 (2004). JPCAFH 1089-5639 10.1021/jp049394x
13. K. Aflatooni, G.A. Gallup, and P.D. Burrow, J. Phys. Chem. A 102, 6205 (1998). JPCAFH 1089-5639 10.1021/jp980865n
14. X. Li, M.D. Sevilla, and L. Sanche, J. Phys. Chem. B 108, 19013 (2004). JPCBFK 1520-6106 10.1021/jp046343r
15. V. Periquet, A. Moreau, S. Carles, J.P. Schermann, and C. Desfrancois, J. Electron Spectrosc. Relat. Phenom. JESRAW 0368-2048 106, 141 (2000). 10.1016/S0368-2048(99)00072-9
16. J.H. Hendricks, S.A. Lyapustina, H.L. de Clercq, and K.H. Bowen, J. Chem. Phys. 108, 8 (1998). JCPSA6 0021-9606 10.1063/1.475360
17. D. Radisic, K.H. Bowen, I. Dabkowska, P. Storoniak, J. Rak, and M. Gutowski, J. Am. Chem. Soc. 127, 6443 (2005). JACSAT 0002-7863 10.1021/ja050724g
18. J. Schied, R. Weinkauf, D. Neumark, and E.W. Schlag, Chem. Phys. 239, 511 (1998). CMPHC2 0301-0104 10.1016/S0301-0104(98)00361-9
19. C. Desfrancois, H. Abdoul-Carime, C.P. Schulz, and J.P. Schermann, Science 269, 1707 (1995). SCIEAS 0036-8075
20. S. Ptasinska, S. Denifl, V. Grill, T.D. Märk, E. Illenberger, and P. Scheier, Phys. Rev. Lett. 95, 093201 (2005). PRLTAO 0031-9007 10.1103/PhysRevLett.95.093201
21. S. Ptasinska, S. Denifl, P. Scheier, E. Illenberger, and T.D. Märk, Angew. Chem., Int. Ed. ACIEF5 1433-7851 44, 6941 (2005). 10.1002/anie.200502040