|
Volumn 20, Issue 45, 2008, Pages
|
Photoresist-buffer-enhanced antiferromagnetic coupling and the giant magnetoresistance effect of Co/Cu multilayers
a
IFW DRESDEN
(Germany)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ANTIFERROELECTRICITY;
ANTIFERROMAGNETIC MATERIALS;
ANTIFERROMAGNETISM;
ELECTRIC RESISTANCE;
HYSTERESIS;
HYSTERESIS LOOPS;
KERR MAGNETOOPTICAL EFFECT;
MAGNETIC FIELD EFFECTS;
MAGNETIC MATERIALS;
MAGNETIC RECORDING;
MAGNETOELECTRONICS;
MAGNETOOPTICAL EFFECTS;
MAGNETORESISTANCE;
MULTILAYERS;
OPTICAL KERR EFFECT;
OPTICAL MULTILAYERS;
OPTICAL PROPERTIES;
PHOTORESISTORS;
PHOTORESISTS;
SURFACE ROUGHNESS;
SURFACE TREATMENT;
[CO/CU];
ANTIFERROMAGNETIC COUPLINGS;
BI LAYERS;
CO/CU MULTILAYERS;
GIANT MAGNETORESISTANCE EFFECTS;
INTERFACIAL ROUGHNESSES;
PHOTORESIST LAYERS;
SI SUBSTRATES;
X-RAY REFLECTIVITIES;
GIANT MAGNETORESISTANCE;
|
EID: 58149354548
PISSN: 09538984
EISSN: 1361648X
Source Type: Journal
DOI: 10.1088/0953-8984/20/45/452202 Document Type: Article |
Times cited : (7)
|
References (21)
|