Correlation of magnetotransport and structure in sputtered Co/Cu multilayers

Journal of Physics Condensed Matter

Volumn 15, Issue 17, 2003, Pages 2471-2491

  Paul, Amitesh ^a   Damm, Thorsten ^a   Bürgler, Daniel E ^a   Stein, Simon ^a   Kohlstedt, Hermann ^a   Grünberg, Peter ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; COPPER; FILM GROWTH; GRAIN SIZE AND SHAPE; KERR MAGNETOOPTICAL EFFECT; MAGNETIC PROPERTIES; MAGNETORESISTANCE; SPUTTER DEPOSITION; THICKNESS MEASUREMENT;

GIANT MAGNETORESISTANCE RATIO; MAGNETOTRANSPORT; OSCILLATORY INTERLAYER EXCHANGE COUPLING; X RAY REFLECTIVITY;

MULTILAYERS;

EID: 0038532382     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/17/304     Document Type: Article

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