Giant magnetoresistance and structural properties in Co/Cu/Co sandwiches with Si and Cr buffer layers

Thin Solid Films

Volumn 375, Issue 1-2, 2000, Pages 55-58

  Shen, Hong Lie ^a   Li, Guan Xiong ^a   Shen, Qin Wo ^a   Li, Tie ^a   Zou, Shi Chang ^a  

^a SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; COPPER; EVAPORATION; HIGH RESOLUTION ELECTRON MICROSCOPY; MAGNETIC ANISOTROPY; MAGNETORESISTANCE; SILICON; TRANSMISSION ELECTRON MICROSCOPY; VACUUM; X RAY DIFFRACTION ANALYSIS;

GIANT MAGNETORESISTANCE (GMR); ULTRAHIGH VACUUM ELECTRON BEAM EVAPORATION;

MAGNETIC FILMS;

EID: 0343844409     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01180-9     Document Type: Article

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