Metal-semiconductor-metal photodiode ultraviolet detector based on high quality ZnO

AIP Conference Proceedings

Volumn 893, Issue , 2007, Pages 1421-1422

  Yu, Ping ^a   Li, Linghui ^a   Lubguban, Jorge A ^a   Ryu, Yungryel ^b   Lee, Tae Seok ^b   White, Henry W ^a  

^a UNIVERSITY OF MISSOURI   (United States)

^b MOXtronics Inc   (United States)

Author keywords

Metal semiconductor metal structures; UV detector; ZnO

Indexed keywords

EID: 58149312609     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2730438     Document Type: Conference Paper

References (4)

1. E. Monry, F. Omnes, and F. Calle, Semicond. Sci. Technol. 18, R33-R51 (2003).
2. D. Walker, et al, Appl. Phys. Lett. 74, 762-764 (1999).
3. O. Katz, G. Bahir, and J. Salzman, Appl. Phys. Lett. 84, 4092-4094 (2004).
4. C. H. Qiu and J. I. Pankove, Appl. Phys. Lett. 70, 1983-1983 (1997).