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Volumn 104, Issue 12, 2008, Pages

Stress induced cracks in carbon black filled elastomers probed by atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; CRACKS; ELECTRIC CIRCUIT BREAKERS; ETHYLENE; NORMAL DISTRIBUTION; POLYMERS;

EID: 58149229123     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3042218     Document Type: Article
Times cited : (7)

References (20)
  • 7
    • 33845522654 scopus 로고    scopus 로고
    • 0163-1829 10.1103/PhysRevB.74.214413, ();, Phys. Rev. B 0163-1829 10.1103/PhysRevB.77.134424 77, 134424 (2008);, Appl. Phys. Lett. 0003-6951 10.1063/1.2943153 92, 233110 (2008).
    • J. Ben Youssef and C. Brosseau, Phys. Rev. B 0163-1829 10.1103/PhysRevB.74.214413 74, 214413 (2006); V. Castel and C. Brosseau, Phys. Rev. B 0163-1829 10.1103/PhysRevB.77.134424 77, 134424 (2008); V. Castel and C. Brosseau, Appl. Phys. Lett. 0003-6951 10.1063/1.2943153 92, 233110 (2008).
    • (2006) Phys. Rev. B , vol.74 , pp. 214413
    • Ben Youssef, J.1    Brosseau, C.2    Castel, V.3    Brosseau, C.4    Castel, V.5    Brosseau, C.6
  • 13
    • 0004237832 scopus 로고
    • edited by E. K. Sichel (Dekker, New York).
    • Carbon Black-Polymer Composites, edited by, E. K. Sichel, (Dekker, New York, 1982).
    • (1982) Carbon Black-Polymer Composites
  • 14
    • 0003902780 scopus 로고
    • edited by J. B. Donnet, R. C. Bansal, and M. J. Wang (Dekker, New York).
    • Carbon Black: Science and Technology, edited by, J. B. Donnet, R. C. Bansal, and, M. J. Wang, (Dekker, New York, 1993).
    • (1993) Carbon Black: Science and Technology
  • 18
    • 0031122070 scopus 로고    scopus 로고
    • Surf. Sci. Lett. 0167-2584 10.1016/S0039-6028(96)01591-9, (); see also, in, edited by R. Meyers (Wiley, Chinchester, 2000).
    • S. N. Magonov, V. Elings, and M. -H. Whangboo, Surf. Sci. Lett. 0167-2584 10.1016/S0039-6028(96)01591-9 375, L385 (1997); see also S. N. Magonov, in Encyclopedia of Analytical Chemistry, edited by, R. Meyers, (Wiley, Chinchester, 2000).
    • (1997) Encyclopedia of Analytical Chemistry , vol.375 , pp. 385
    • Magonov, S.N.1    Elings, V.2    Whangboo, M.-H.3    Magonov, S.N.4
  • 20
    • 0001348245 scopus 로고
    • 0020-7268, ();, Phys. Rev. E 1063-651X 10.1103/PhysRevE.62.6164 62, 6164 (2000);, Phys. Rev. B 63, 134204 (2001).
    • S. N. Zhurkov, Int. J. Fract. Mech. 0020-7268 1, 311 (1965); S. Roux, Phys. Rev. E 1063-651X 10.1103/PhysRevE.62.6164 62, 6164 (2000); P. Arndt and T. Nattermann, Phys. Rev. B 63, 134204 (2001).
    • (1965) Int. J. Fract. Mech. , vol.1 , pp. 311
    • Zhurkov, S.N.1    Roux, S.2    Arndt, P.3    Nattermann, T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.