Femtosecond laser induced submicrometer structures on the ablation crater walls of II-VI semiconductors in water

Applied Surface Science

Volumn 255, Issue 7, 2009, Pages 4351-4354

  Gong, W W ^a,b   Zheng, Z H ^a   Zheng, J J ^a,b   Zhao, H F ^a   Ren, X G ^a   Lu, S Z ^a  

^a CHANGCHUN INSTITUTE OF OPTICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Ablation crater; Columns; Femtosecond laser pulse; Ripples

Indexed keywords

ABLATION; CADMIUM SULFIDE; COLUMNS (STRUCTURAL); COPPER COMPOUNDS; FEMTOSECOND LASERS; LASER ABLATION; LASER BEAM EFFECTS; LASER PULSES; SCANNING ELECTRON MICROSCOPY; SELENIUM COMPOUNDS; SEMICONDUCTOR LASERS; SURFACE WAVES; ULTRASHORT PULSES; WIDE BAND GAP SEMICONDUCTORS; ZINC SULFIDE;

CHARACTERISTIC SURFACES; COLUMNAR STRUCTURES; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; FORMATION MECHANISM; INTERFERENCE EFFECTS; RIPPLES; SELF ORGANIZATIONS; SUBMICROMETER STRUCTURES;

II-VI SEMICONDUCTORS;

EID: 58149104376     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.10.118     Document Type: Article

References (24)

1. Nolte S., Momma C., Jacobs H., Tünnermann A., Chickov B.N., Wellegehausen B., and Wellig H. J. Opt. Soc. Am. B 14 (1997) 2716
2. Liu X., Du D., and Mourou G. IEEE J. Quantum Electron. 33 (1997) 1706
3. Schmidt V., Husinsky W., and Betz G. Appl. Surf. Sci. 197/198 (2002) 145
4. Borowiec A., and Haugen H.K. Appl. Phys. Lett. 82 (2002) 4462
5. Costache F., Henyk M., and Reif J. Appl. Surf. Sci. 208/209 (2003) 486
6. Baudach S., Bonse J., and Kautek W. Appl. Phys. A 69 (1999) 395
7. Malshe A.P., Ozkan A.M., Railkar T.A., Molian P.A., and Brown W.D. Mater. Res. Soc. Symp. Proc. 526 (1998) 123
8. Seifert1 G., Kaempfe M., Syrowatka F., Harnagea C., Hesseh D., and Graener H. Appl. Phys. A 81 (2005) 799
9. Yoo J.H., Jeong S.H., and Greif R. J. Appl. Phys. 88 (2000) 1638
10. Costache F., Henyk1 M., and Reif J. Appl. Surf. Sci. 208 209 (2003) 486
11. Farsari M., Filippidis G., Zoppel S., Reider G.A., and Fotakis C. J Micromech. Microeng. 15 (2005) 1786
12. Wynne A.E., and Stuart B.C. Appl. Phys. A 76 (2003) 373
13. Weck1 A., Crawford T.H.R., Wilkinson D.S., and Haugen H.K. Appl. Phys. A 89 (2007) 1001
14. Guosheng Z., Fauchet P.M., and Siegman A.E. Phys. Rev. B 26 (1982) 5366
15. Kautek1 W., Rudolph P., Daminelli G., and Krüger J. Appl. Phys. A 81 (2005) 65
16. Seifert1 G., Kaempfe1 M., Syrowatka F., Harnagea C., Hesse D., and Graener1 H. Appl. Phys. A 81 (2005) 799
17. Wagner R., Gottmann J., Horn A., and Kreutz E.W. Appl. Surf. Sci. 252 (2006) 8576
18. Rudolph P., and Kautek W. Thin Solid Films 453 454 (2004) 537
19. Bonse J., Baudach S., Krüger J., Kautek W., and Lenzner M. Appl. Phys. A 74 (2002) 19
20. Liu P.L., Yen R., Bloembergen N., and Hodgson R.T. Appl. Phys. Lett. 34 (1979) 864
21. Maatz G., Heisterkamp A., Lubatschowski H., Barcikowski S., Fallnich C., Welling H., and Ertmer W. J. Opt. A: Pure Appl. Opt. 2 (2000) 59
22. Duan X., and Lieber C. Adv. Mater. 12 (2000) 298
23. Jiang Y., Meng X., Yiu W., Liu J., Ding J., Lee C., and Lee S. J. Phys. Chem. B 108 (2004) 2784
24. Jia T., Baba M., Huangb M., Zhao F., and Qiu J. Solid State Commun. 128 (2003) 295