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Volumn 255, Issue 7, 2009, Pages 4177-4179

Structural characterization of β-V 2 O 5 films prepared by DC reactive magnetron sputtering

Author keywords

Deposition temperature; Raman spectra; Sputtering; Structure; V 2 O 5 films

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON SPECTROSCOPY; MAGNETRON SPUTTERING; RAMAN SCATTERING; REACTIVE SPUTTERING; SPUTTERING; STRUCTURE (COMPOSITION); THERMODYNAMIC STABILITY; VANADIUM PENTOXIDE; X RAY DIFFRACTION;

EID: 58149101298     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.11.002     Document Type: Article
Times cited : (39)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.