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Volumn 255, Issue 7, 2009, Pages 4177-4179
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Structural characterization of β-V 2 O 5 films prepared by DC reactive magnetron sputtering
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Author keywords
Deposition temperature; Raman spectra; Sputtering; Structure; V 2 O 5 films
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Indexed keywords
CRYSTAL STRUCTURE;
ELECTRON SPECTROSCOPY;
MAGNETRON SPUTTERING;
RAMAN SCATTERING;
REACTIVE SPUTTERING;
SPUTTERING;
STRUCTURE (COMPOSITION);
THERMODYNAMIC STABILITY;
VANADIUM PENTOXIDE;
X RAY DIFFRACTION;
DC REACTIVE MAGNETRON SPUTTERING;
DEPOSITION TEMPERATURES;
HIGH DEPOSITION TEMPERATURE;
HIGH TEMPERATURE CONDITION;
MICRO RAMAN SPECTROSCOPY;
REACTIVE MAGNETRON SPUTTERING;
REACTIVE SPUTTERING PROCESS;
STRUCTURAL CHARACTERIZATION;
FILM PREPARATION;
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EID: 58149101298
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2008.11.002 Document Type: Article |
Times cited : (39)
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References (17)
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