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Surface and Interface Analysis

Volumn 37, Issue 4, 2005, Pages 406-411

Surface analysis of pulsed laser-deposited V2O5 thin films and their lithium intercalated products studied by Raman spectroscopy

(5) Ramana, C V a,d Smith, R J a Hussain, O M b Massot, M c Julien, C M c

a MONTANA STATE UNIVERSITY (United States)

b SRI VENKATESWARA UNIVERSITY (India)

c CNRS (France)

d MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY (United States)

Author keywords

Lithium intercalation; Pulsed laser deposition; Raman spectroscopy; Structure; Vanadium pentoxide

Indexed keywords

LITHIUM; PULSED LASER DEPOSITION; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SURFACE PROPERTIES; SURFACE STRUCTURE; SWITCHING; THIN FILMS;

GROWTH TEMPERATURE; LITHIUM INTERCALATION; STRUCTURE; VANADIUM PENTOXIDE;

VANADIUM COMPOUNDS;

EID: 17044363194 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.2018 Document Type: Conference Paper

Times cited : (106)

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