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Volumn , Issue , 2008, Pages 315-320

Industrial and technical aspects of chip embedding technology

Author keywords

Chip embedding; Industrialisation of embedding; Ultra fine line patterning

Indexed keywords

CHIP EMBEDDING; CONCURRENT DEVELOPMENTS; DIE ASSEMBLIES; ELECTRICAL PERFORMANCES; EMBEDDED COMPONENTS; EMBEDDING TECHNOLOGIES; INDUSTRIALISATION OF EMBEDDING; INTER-CONNECTS; MANUFACTURING CHALLENGES; MANUFACTURING PLANTS; MANUFACTURING PROCESSES; MECHANICAL ENVIRONMENTS; MULTIPLE LAYERS; ORGANIC SUBSTRATES; PRODUCTION LINES; SEMICONDUCTOR CHIPS; TECHNICAL ASPECTS; TESTING METHODOLOGIES; THIN CHIPS; ULTRA FINE LINE PATTERNING;

EID: 58149098532     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESTC.2008.4684368     Document Type: Conference Paper
Times cited : (32)

References (5)
  • 1
    • 49349100451 scopus 로고    scopus 로고
    • Integrated component technologies: Opportunities, economics and trends
    • October
    • S. Norlyng, "Integrated component technologies: Opportunities, economics and trends", IMAPS Nordic, October 2003.
    • (2003) IMAPS Nordic
    • Norlyng, S.1
  • 5
    • 35348893145 scopus 로고    scopus 로고
    • Technical Understanding of Resin Coated Copper (RCC) lamination processes for realisation of reliable chip embedding technologies
    • Reno, NV, May 29- June 1
    • D. Manessis, S-F.Yen, A. Ostmann, R. Aschenbrenner and H. Reichl, "Technical Understanding of Resin Coated Copper (RCC) lamination processes for realisation of reliable chip embedding technologies", Proc. Electronics Components & Technology Conference (ECTC) 2007, Reno, NV, May 29- June 1, 2007, pp. 278-285.
    • (2007) Proc. Electronics Components & Technology Conference (ECTC) 2007 , pp. 278-285
    • Manessis, D.1    Yen, S.-F.2    Ostmann, A.3    Aschenbrenner, R.4    Reichl, H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.