Application of Weibull distribution analysis to the dielectric failure of multilayer ceramic capacitors

Materials Science and Engineering B

Volumn 47, Issue 3, 1997, Pages 197-203

  Wang, Y ^a,b   Chan, Y C ^b   Gui, Z L ^a   Webb, D P ^b   Li, L T ^a  

^a TSINGHUA UNIVERSITY   (China)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Breakdown; Dielectric; Failure; Multilayer ceramic capacitor (MLC); Weibull distribution

Indexed keywords

DIELECTRIC PROPERTIES OF SOLIDS; ELECTRIC BREAKDOWN OF SOLIDS; FAILURE ANALYSIS; MULTILAYERS; STRENGTH OF MATERIALS; WEIBULL DISTRIBUTION;

MULTILAYER CERAMIC CAPACITORS (MLC);

CERAMIC CAPACITORS;

EID: 0038553013     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(97)00041-X     Document Type: Article

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