Effects of Calcination on Life Time of BaTiO3-based Multilayer Ceramic Chip Capacitors with Nickel Electrodes

International Journal of the Society of Materials Engineering for Resources

Volumn 5, Issue 1, 1997, Pages 91-104

  Sumita, Shigekazu ^a   Nomura, Takeshi ^a  

^a TDK CORPORATION   (Japan)

Author keywords

Calcination; Degradation; Highly Acceler ated Life Test (HALT); Microstructure; Multilayer Capacitor

Indexed keywords

EID: 85009648637     PISSN: 13479725     EISSN: 18846629     Source Type: Journal    
DOI: 10.5188/ijsmer.5.91     Document Type: Article

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