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Volumn , Issue , 2008, Pages 73-76

Correlation of PDN impedance with jitter and voltage margin for high speedchannels

Author keywords

[No Author keywords available]

Indexed keywords

DISTRIBUTED PARAMETER NETWORKS; DISTRIBUTION OF GOODS; ELECTRIC NETWORK ANALYSIS; ELECTRIC POWER DISTRIBUTION; ELECTRONIC EQUIPMENT MANUFACTURE; ELECTRONICS PACKAGING; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT MANUFACTURE; SANITARY SEWERS;

EID: 58049124944     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPEP.2008.4675880     Document Type: Conference Paper
Times cited : (9)

References (8)
  • 5
    • 20444403734 scopus 로고    scopus 로고
    • Analysis and suppression of SSN noise coupling between power/ground plane cavities through cutouts in multilayer packages and PCBs
    • May
    • J. Lee, M. D. Rotaru, M. K. Iyer, H. Kim, and J. Kim, "Analysis and suppression of SSN noise coupling between power/ground plane cavities through cutouts in multilayer packages and PCBs", IEEE Trans. Adv.Package., vol. 28, no. 2, pp. 298-309, May 2005.
    • (2005) IEEE Trans. Adv.Package , vol.28 , Issue.2 , pp. 298-309
    • Lee, J.1    Rotaru, M.D.2    Iyer, M.K.3    Kim, H.4    Kim, J.5
  • 6
    • 33747610416 scopus 로고    scopus 로고
    • Jongbae Park, Hyungsoo Kim, Youchul leong, Jingook Kim, Jun So Pak, Dong Gun Kam, Joungho Kim, Modeling and measurement of simultaneous switching noise coupling through signal via transition, IEEE Trans. Adv. Packaging, 29, pp. 548-559, Aug 2006.
    • Jongbae Park, Hyungsoo Kim, Youchul leong, Jingook Kim, Jun So Pak, Dong Gun Kam, Joungho Kim, "Modeling and measurement of simultaneous switching noise coupling through signal via transition", ", IEEE Trans. Adv. Packaging, vol. 29, pp. 548-559, Aug 2006.
  • 8
    • 51349101891 scopus 로고    scopus 로고
    • Controllable parameters identification for high speed channel through signal-power integrity combined analysis
    • May
    • Myoung Joon Choi, Pandit Vishram S., Woong Hwan Ryu, "Controllable parameters identification for high speed channel through signal-power integrity combined analysis", Electronic Components and Technology Conference, pp. 658-663, May 2008.
    • (2008) Electronic Components and Technology Conference , pp. 658-663
    • Joon, M.1    Choi, P.V.S.2    Hwan Ryu, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.