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Volumn , Issue , 2008, Pages 270-273

A single photon detector implemented in a 130nm CMOS imaging process

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHES (SNOWSLIDES); DETECTORS; ELECTRIC FIELDS; JITTER; OPTICAL DATA PROCESSING; PARTICLE BEAMS; PASSIVATION; PHOTODETECTORS; QUENCHING; SEMICONDUCTING SILICON; SNOW; TIME MEASUREMENT; TIMING JITTER;

EID: 58049116358     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2008.4681750     Document Type: Conference Paper
Times cited : (36)

References (7)
  • 1
    • 0020734909 scopus 로고
    • A Semiconductor Detector for Measuring Ultraweak Fluorescence Decays with 70ps FWHM Resolution
    • S. Cova, A. Longoni, A. Andreoni, R. Cubeddu, "A Semiconductor Detector for Measuring Ultraweak Fluorescence Decays with 70ps FWHM Resolution", IEEE Journal of Quantum Electronics, vol. 10 (4), pp. 630-634, 1983.
    • (1983) IEEE Journal of Quantum Electronics , vol.10 , Issue.4 , pp. 630-634
    • Cova, S.1    Longoni, A.2    Andreoni, A.3    Cubeddu, R.4
  • 2
    • 0042768173 scopus 로고    scopus 로고
    • Single photon detector fabricated in a complementary metal-oxide-semiconductor high-voltage technology
    • A. Rochas, M. Gani, B. Furrer, P. A. Besse, R. S. Popovic, G. Ribordy, and N. Gisin, "Single photon detector fabricated in a complementary metal-oxide-semiconductor high-voltage technology", Review of Scientific Instruments, vol. 74 (7), pp. 3263-3270, 2003.
    • (2003) Review of Scientific Instruments , vol.74 , Issue.7 , pp. 3263-3270
    • Rochas, A.1    Gani, M.2    Furrer, B.3    Besse, P.A.4    Popovic, R.S.5    Ribordy, G.6    Gisin, N.7
  • 4
    • 46049116691 scopus 로고    scopus 로고
    • M. Cohen, F. Roy, D. Herault, Y. Cazaux, A. Gandolfi, JP. Reynard, C. Cowache, E. Bruno, T. Girault, J. Vaillant, F. Barbier, Y. Sanchez, N. Hotellier, O. LeBorgne, C. Augier, A. Inard, T. Jagueneau, C. Zinck, J. michailos, E. Mazaleyrat, Fully Optimized Cu based process with dedicated cavity etch for 1.75|Jm and 1.45|Jm pixel pitch CMOS Image Sensors, IEDM, 2006.
    • M. Cohen, F. Roy, D. Herault, Y. Cazaux, A. Gandolfi, JP. Reynard, C. Cowache, E. Bruno, T. Girault, J. Vaillant, F. Barbier, Y. Sanchez, N. Hotellier, O. LeBorgne, C. Augier, A. Inard, T. Jagueneau, C. Zinck, J. michailos, E. Mazaleyrat, " Fully Optimized Cu based process with dedicated cavity etch for 1.75|Jm and 1.45|Jm pixel pitch CMOS Image Sensors", IEDM, 2006.
  • 5
    • 33750516320 scopus 로고    scopus 로고
    • STI-bounded Single-photon Avalanche Diode in a Deep-submicrometer CMOS Technology
    • H. Finkelstein, M. J. Hsu, and S. C. Esener, "STI-bounded Single-photon Avalanche Diode in a Deep-submicrometer CMOS Technology", IEEE Electron Device Letters, vol. 27 (11), pp. 887-889, 2006
    • (2006) IEEE Electron Device Letters , vol.27 , Issue.11 , pp. 887-889
    • Finkelstein, H.1    Hsu, M.J.2    Esener, S.C.3
  • 7
    • 40949127455 scopus 로고    scopus 로고
    • N. Faramarzpour, M.J. Deen, S. Shirani and Q. Fang, Fully Integrated Single Photon Avalanche Diode Detector in Standard CMOS 0.18-|Jm Technology'TEEE Transactions on Electron Devices, 55 (3), pp. 760-767, 2008
    • N. Faramarzpour, M.J. Deen, S. Shirani and Q. Fang, "Fully Integrated Single Photon Avalanche Diode Detector in Standard CMOS 0.18-|Jm Technology'TEEE Transactions on Electron Devices, vol. 55 (3), pp. 760-767, 2008


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.